发明名称 METHODS AND APPARATUSES FOR ANALYZING SOLDER PLATING SOLUTIONS
摘要 The present invention relates to methods and apparatus for determining concentrations of various inorganic or organic components in solder plating solutions, which include titration or parallel titration methods, direct potentiometry methods, calibration methods, and/or UV-Vis absorption analysis.
申请公布号 WO03076694(A3) 申请公布日期 2004.09.30
申请号 WO2003US05568 申请日期 2003.02.24
申请人 ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 ROBERTSON, PETER, M.;KING, MACKENZIE, E.;HILGARTH, MONICA, K.;SCHOMBURG, CORY;TOLMACHEV, YURIJ;SCHOENROGGE, UWE
分类号 C25D21/12;G01N31/16 主分类号 C25D21/12
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