发明名称 |
Method to calibrate a temperature sensitive ring oscillator with minimal test time |
摘要 |
The present invention provides for calibrating a TSRO with two tests, wherein generating a first or second calibration value does not substantially alter the temperature performed within the first or second test. The first calibration value is generated during a first test at a first temperature. The first test can be a wafer test, a module test, a burn-in test, and so on. The first calibration value is stored with an e-fuse in the integrated circuit. A second calibration value is generated during a second integrated circuit test of the integrated circuit at a second temperature. The second test can be a test that is performed at a temperature other than the first test. The second calibration value is stored with an e-fuse in the integrated circuit.
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申请公布号 |
US2004190585(A1) |
申请公布日期 |
2004.09.30 |
申请号 |
US20030401326 |
申请日期 |
2003.03.27 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BERNDLMAIER ZACHARY ERICH;STASIAK DANIEL LAWRENCE;WANG MICHAEL FAN |
分类号 |
G01K15/00;(IPC1-7):G01K15/00 |
主分类号 |
G01K15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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