发明名称 Interferometric servo control system for stage metrology
摘要 The invention features a method for determining non-linear cyclic errors in a metrology system that positions a measurement object under servo-control based on an interferometrically derived position signal. The method includes: translating the measurement object under servo-control at a fixed speed; identifying frequencies of any oscillations in the position of measurement object as it is translated at the fixed speed; and determining amplitude and phase coefficients for sinusoidal components at the identified frequencies which when combined with the position signal suppress the oscillations. The invention also features a method for positioning a measurement object under servo-control based on an interferometrically derived position signal indicative of a position for the measurement object. This method includes: generating a compensated position signal based on the interferometrically derived position signal and at least one correction term that has a sinusoidal dependence on the position of the measurement object; and repositioning the measurement object based on the compensated position signal and a desired position for the measurement object.
申请公布号 US2004189998(A1) 申请公布日期 2004.09.30
申请号 US20040819257 申请日期 2004.04.05
申请人 ZYGO CORPORATION, A DELAWARE CORPORATION 发明人 HILL HENRY A.
分类号 G01B9/02;G02B9/02;G02B11/02;G03F7/20;G05B19/19;(IPC1-7):G01B9/02 主分类号 G01B9/02
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