发明名称 |
SEMICONDUCTOR MEMORY DEVICE HAVING REFRESH CHARACTERISTICS VARIABLE ACCORDING TO OPERATION MODE, IN WHICH PRECHARGE VOLTAGE IS SET LOWER THAN NORMAL OPERATION MODE AT REFRESH MODE |
摘要 |
PURPOSE: A semiconductor memory device having refresh characteristics variable according to an operation mode is provided, which reduces current consumption during a self refresh operation and varies a bit line precharge voltage according to its operation mode. CONSTITUTION: A plurality of memory cells have word lines and bit lines arranged in a matrix. A precharge voltage generator circuit(140) receives a reference voltage and generates the first precharge voltage and the second precharge voltage lower than the first precharge voltage. A switch circuit(150) selects the first and the second precharge voltages in response to selection signals indicating operation modes. And a precharge circuit precharges the bit lines with a voltage selected by the switch circuit.
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申请公布号 |
KR20040082637(A) |
申请公布日期 |
2004.09.30 |
申请号 |
KR20030017239 |
申请日期 |
2003.03.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, SANG GYUN |
分类号 |
G11C11/407;(IPC1-7):G11C11/407 |
主分类号 |
G11C11/407 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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