发明名称 SEMICONDUCTOR MEMORY DEVICE HAVING REFRESH CHARACTERISTICS VARIABLE ACCORDING TO OPERATION MODE, IN WHICH PRECHARGE VOLTAGE IS SET LOWER THAN NORMAL OPERATION MODE AT REFRESH MODE
摘要 PURPOSE: A semiconductor memory device having refresh characteristics variable according to an operation mode is provided, which reduces current consumption during a self refresh operation and varies a bit line precharge voltage according to its operation mode. CONSTITUTION: A plurality of memory cells have word lines and bit lines arranged in a matrix. A precharge voltage generator circuit(140) receives a reference voltage and generates the first precharge voltage and the second precharge voltage lower than the first precharge voltage. A switch circuit(150) selects the first and the second precharge voltages in response to selection signals indicating operation modes. And a precharge circuit precharges the bit lines with a voltage selected by the switch circuit.
申请公布号 KR20040082637(A) 申请公布日期 2004.09.30
申请号 KR20030017239 申请日期 2003.03.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SANG GYUN
分类号 G11C11/407;(IPC1-7):G11C11/407 主分类号 G11C11/407
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