SEMICONDUCTOR MEMORY DEVICE HAVING FUNCTION TO JUDGE STANDBY CURRENT ERROR

摘要

PURPOSE: A semiconductor memory device having a function to judge a standby current error is provided, which judges defective rows and columns causing the standby current error. CONSTITUTION: The semiconductor memory device(100) includes an array(110) of memory cells arranged in rows and columns. A unit selects the memory cells of the array in a repair unit during a test operation mode. And a unit(RPSW0-RPSWm) supplies a power supply voltage to the memory cells selected in a repair unit during the test operation mode and blocks power supplied to the other memory cells. The memory cells of the array are repaired in a unit of row.