发明名称 MICROSCOPY INSPECTION SYSTEM AND MICROSCOPY INSPECTION METHOD FOR PLURALITY OF OBSERVERS
摘要 <P>PROBLEM TO BE SOLVED: To accurately align an image generated by an optical beam path with an electronically generated image in a surgical microscope which is equipped with separate eyepiece systems for a plurality of observers. <P>SOLUTION: The microscopic system comprises one objective, a plurality of eyepiece systems, and an image projector having a display device so that the observers can watch the image on the display device and the image by the eyepiece system in a state where they are superposed. One eyepiece system is constituted so that its optical setting can be changed independently of the other eyepiece systems, whereby the microscopic image of an object optically generated by the eyepiece system is superposed on the electronically generated image by changing the optical setting of the eyepiece system. <P>COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004272200(A) 申请公布日期 2004.09.30
申请号 JP20030327752 申请日期 2003.09.19
申请人 CARL-ZEISS-STIFTUNG TRADING AS CARL ZEISS 发明人 HERMANN KARLHEINZ;RUDOLPH FRANK;SCHNEIDER MARTIN;STEFFEN JOACHIM;WIRTH MICHAEL
分类号 A61B19/00;G02B21/00;G02B21/18;G02B21/22;G02B21/36 主分类号 A61B19/00
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