发明名称 |
MICROSCOPY INSPECTION SYSTEM AND MICROSCOPY INSPECTION METHOD FOR PLURALITY OF OBSERVERS |
摘要 |
<P>PROBLEM TO BE SOLVED: To accurately align an image generated by an optical beam path with an electronically generated image in a surgical microscope which is equipped with separate eyepiece systems for a plurality of observers. <P>SOLUTION: The microscopic system comprises one objective, a plurality of eyepiece systems, and an image projector having a display device so that the observers can watch the image on the display device and the image by the eyepiece system in a state where they are superposed. One eyepiece system is constituted so that its optical setting can be changed independently of the other eyepiece systems, whereby the microscopic image of an object optically generated by the eyepiece system is superposed on the electronically generated image by changing the optical setting of the eyepiece system. <P>COPYRIGHT: (C)2004,JPO&NCIPI |
申请公布号 |
JP2004272200(A) |
申请公布日期 |
2004.09.30 |
申请号 |
JP20030327752 |
申请日期 |
2003.09.19 |
申请人 |
CARL-ZEISS-STIFTUNG TRADING AS CARL ZEISS |
发明人 |
HERMANN KARLHEINZ;RUDOLPH FRANK;SCHNEIDER MARTIN;STEFFEN JOACHIM;WIRTH MICHAEL |
分类号 |
A61B19/00;G02B21/00;G02B21/18;G02B21/22;G02B21/36 |
主分类号 |
A61B19/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|