发明名称 |
ELECTRON BEAM SOURCE, ELECTRON OPTICAL APPARATUS USING SUCH BEAM SOURCE, AND METHOD OF OPERATING ELECTRO BEAM SOURCE |
摘要 |
PROBLEM TO BE SOLVED: To provide an electron beam source of which adjusting performance is improved so as to obtain desired electron beam intensity, and which operates at low source surface temperatures. SOLUTION: This electron beam source 1 is provided with a source surface illuminated with a photon beam 29 of adjustable intensity. The photon beam assists emission of electrons from the source surface due to a photo effect. Emission of electrons is further assisted by an electric extraction field. Furthermore, a heater is provided to further assist emission of electrons by a thermionic effect. An electron beam current is measured, and the intensity of the photon beam is adjusted based on the measured electron beam current. COPYRIGHT: (C)2004,JPO&NCIPI
|
申请公布号 |
JP2004273419(A) |
申请公布日期 |
2004.09.30 |
申请号 |
JP20030332078 |
申请日期 |
2003.09.24 |
申请人 |
LEO ELEKTRONENMIKROSKOPIE GMBH |
发明人 |
STEIGERWALD MICHAEL |
分类号 |
H01J37/06;H01J37/073;H01J37/075;H01J37/28;H01L21/027;(IPC1-7):H01J37/073 |
主分类号 |
H01J37/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|