发明名称 |
Scanning electron microscope and sample observing method using it |
摘要 |
The invention provides a sample observation method capable of understanding the three-dimensional shape of a sample in a wider range. The observation method of the invention calculates heights (height differences) in the whole domain of an image, from plural sheets of images of different field-of-view angles, being in focus over the whole image, attained by means of the focal depth expanding function to thereby create a map (Z map) of the height information by each pixel, and displays a three-dimensional image as a bird's-eye view. The method also displays to superpose a Z map attained from image signals reflecting the surface structure on a Z map attained from image signals reflecting the composition information with different colors, which makes it possible to clearly understand the spatial distribution of a substance of unique composition inside the sample.
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申请公布号 |
US2004188611(A1) |
申请公布日期 |
2004.09.30 |
申请号 |
US20040750838 |
申请日期 |
2004.01.05 |
申请人 |
TAKEUCHI SHUICHI;NAKAGAWA MINE;SATO MITSUGU;TAKANE ATSUSHI;NIMURA KAZUTAKA |
发明人 |
TAKEUCHI SHUICHI;NAKAGAWA MINE;SATO MITSUGU;TAKANE ATSUSHI;NIMURA KAZUTAKA |
分类号 |
G01B15/04;G01Q30/02;G01Q30/04;H01J37/21;H01J37/22;H01J37/244;H01J37/28;(IPC1-7):H01J37/28;G01N23/225 |
主分类号 |
G01B15/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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