发明名称 METHOD OF MANUFACTURE AND IDENTIFICATION OF SEMICONDUCTOR CHIP MARKED FOR IDENTIFICATION WITH INTERNAL MARKING INDICIA AND PROTECTION THEREOF BY NON-BLACK LAYER AND DEVICE PRODUCED THEREBY
摘要 An electronic integrated circuit has a planar front surface and a planar backsurface. Internal marking indicia identification are marked upon an marking surface on the exterior surface of the chip. The internal identification indicia on the chip surface are protected against remarking by a non-black, colored, optically transmissive layer, so the indicia are visible through the optically transmissive material. Electrical interconnection means connect to the electrical contact site through the package. There is least one electrical contact site on an exterior surface of the chip.
申请公布号 SG106050(A1) 申请公布日期 2004.09.30
申请号 SG20010000487 申请日期 2001.01.30
申请人 MEGIC CORPORATION 发明人 LIN MOU-SHIUNG;LEE CHIEN HSUN
分类号 H01L23/544 主分类号 H01L23/544
代理机构 代理人
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