| 摘要 |
PROBLEM TO BE SOLVED: To debug a circuit section which does not depend on a PHY circuit, without newly preparing an expensive measuring instrument, in a high-speed serial controller incorporating the PHY circuit. SOLUTION: A test circuit 2 is connected to each interface section of the PHY circuits 3, 8 that are provided at a physical layer and convert an analog signal flowing to wiring into a digital signal, and LINC circuits 4, 7 that are provided at a data link layer, adjacent to the physical layer for converting data converted to a digital signal by the PHY circuits 3, 8 into data in a prescribed format. Then, parallel data, flowing to the interface sections, are observed directly by means of a serial test interface 25. COPYRIGHT: (C)2004,JPO&NCIPI
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