发明名称 METHOD FOR CLEANING PROCESSING SYSTEM
摘要 PROBLEM TO BE SOLVED: To solve the problem that group 7B atoms or compounds containing them remain in a processing chamber while sticking to the inner wall face or the structural member thereof during cleaning process of the processing chamber, and taken into a semiconductor film under deposition in a subsequent process, i.e. a plasma CVD process. SOLUTION: In the cleaning method of a processing system for removing by-products, principally polysilane, produced in the processing chamber of a plasma CVD system, a negative voltage is applied to the first electrode which supplies power to the processing system and a negative potential is brought thereto. Cleaning is performed by introducing gas containing group 7B elements without causing a plasma. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004273616(A) 申请公布日期 2004.09.30
申请号 JP20030059969 申请日期 2003.03.06
申请人 CANON INC 发明人 KODA YUZO
分类号 C23C16/44;H01L21/205;(IPC1-7):H01L21/205 主分类号 C23C16/44
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