发明名称 ROTATION TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a rotation test device which can handle changes in rotation speeds. SOLUTION: The rotation test device is to detect conditions of a sample S that is rotating with a predetermined rotation speed using a predetermined sampling frequency. The device comprises a plurality of calculation means corresponding to sample rotation speeds to calculate sampling data obtained by the condition detection, and a processing means 50 which selects and conducts calculation means determined by the range of the sample rotation speeds. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004271484(A) 申请公布日期 2004.09.30
申请号 JP20030066155 申请日期 2003.03.12
申请人 AKASHI CORP 发明人 MATSUDA YUTAKA;ODA MITSURU
分类号 G01M1/16;(IPC1-7):G01M1/16 主分类号 G01M1/16
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