发明名称 THIN-FILM EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide a thin-film equipment capable of forming a stable thin film. SOLUTION: In the thin film equipment, a flow regulating plate 7 which is composed of transparent silica glass and in which a mass of micropores 6 which supply gas to a semiconductor substrate 11 are arranged in parallel multiple sequence is arranged in a reactor 1. Water-cooled pipes 10 composed of transparent silica glass are welded to an upper surface of the flow regulating plate so as to sew between the respective sequences of the micropores. Since rise in temperature of the flow regulating plate 7 composed of transparent silica glass can be restrained, smearing of the flow regulating plate 7 which is to be caused by sludge is prevented, observation of the semiconductor substrate 11 through the flow regulating plate between the water-cooled pipes 10 and direct temperature measurement with an infrared ray radiation thermometer become possible, and exact control of temperature becomes possible. Further, stable thin film formation is enabled. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004273565(A) 申请公布日期 2004.09.30
申请号 JP20030059005 申请日期 2003.03.05
申请人 TOSHIBA CERAMICS CO LTD 发明人 SUZUKI SHUNICHI;ABE YOSHIHISA;KOMIYAMA JUN;NAKANISHI HIDEO
分类号 C23C16/44;H01L21/205;(IPC1-7):H01L21/205 主分类号 C23C16/44
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