| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection device enabling the inspection of a parallel-connected low-impedance circuit which is difficult to determine by an inspection with application of a DC or AC minute signal and further a flexible electronic circuit inspection device. SOLUTION: This electronic circuit inspection device 10 comprises a pulse signal source 15 for applying a pulse signal to a circuit to be inspected, an analog/digital converter 11 for analog-digital converting a transient response signal to the pulse signal of the circuit to be inspected, a microprocessor 12 for arithmetically processing the digitally-converted transient response signal, extracting the frequency of a vibration waveform based on the peak time or zero-cross time of the transient response signal waveform, and comparing it with the vibration frequency of a normal circuit, thereby determining the abnormality of the circuit to be inspected, and a display device 14 for displaying the inspection result of the circuit to be inspected. COPYRIGHT: (C)2004,JPO&NCIPI
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