发明名称 |
Method of fabricating nano-scale resistance cross-point memory array and device |
摘要 |
<p>A method of fabricating a nano-scale resistance cross-point memory array includes preparing a silicon substrate (60); depositing silicon oxide on the substrate to a predetermined thickness; forming a nano-scale trench in the silicon oxide; depositing a first connection line in the trench; depositing a memory resistor layer (78) in the trench on the first connection line; depositing a second connection line in the trench on the memory resistor layer; and completing the memory array. A cross-point memory array includes a silicon substrate (60); a first connection line (76) formed on the substrate; a colossal magnetoresistive layer (78) formed on the first connection line; a silicon nitride layer (82) formed on a portion of the colossal magnetoresistive layer; and a second connection line formed (86) adjacent the silicon nitride layer and on the colossal magnetoresistive layer. <IMAGE></p> |
申请公布号 |
EP1463060(A2) |
申请公布日期 |
2004.09.29 |
申请号 |
EP20040251472 |
申请日期 |
2004.03.15 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
HSU, SHENG TENG;ZHUANG, WEIWEI;PAN, WEI;ZHANG, FENGYAN |
分类号 |
H01L21/8246;H01L27/105;H01L27/24;G11C13/00;H01L27/115;H01L43/08;(IPC1-7):G11C11/16;G11C11/22;H01L27/22 |
主分类号 |
H01L21/8246 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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