发明名称 Method and system for the indirect measurement of a physical value
摘要 The present invention provides a measurement method for measuring a physical value. The method comprises, during a same clock cycle, forming an input signal, a reference signal and an offset signal, the input signal including a parasitic value and a useful measurement value; deriving a relationship between the input signal where the parasitic value has been cancelled out, and the reference signal; and from this relationship, determining a value relating to the physical value. The input signal, reference signal and offset signal are respectively associated with an input element, a reference element and a parasitic element. All elements have a common driving signal, and the parasitic value is depending on the common driving signal. The fact that different signals are formed during a same measurement cycle, and that these signals are sufficient to obtain the desired physical value, makes the measurement method of the present invention faster than prior art measurement methods: only one conversion cycle is needed against two cycles needed for dual slope analog-to-digital conversion. <??>The present invention also provides a system for measuring a physical value. <IMAGE>
申请公布号 EP1463205(A1) 申请公布日期 2004.09.29
申请号 EP20030447069 申请日期 2003.03.28
申请人 AMI SEMICONDUCTOR BELGIUM BVBA 发明人 HORSKY,PAVEL;KOUDAR,IVAN
分类号 G01D3/028;H03M3/00;(IPC1-7):H03M3/02;G01D3/02;G01D5/12 主分类号 G01D3/028
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