发明名称 Apparatus for measuring the position of a probe in a coordinate measuring machine
摘要 A first normal (4) comprises a flat plane with a main surface (13) supporting a grid line arrangement (7). A second normal (24) comprises a two-dimensional elongate piece, which can be moved in two-dimensions in a contact-free manner at right angles to the main surface. A position measuring system (10) determines the spatial position of the second normal (24) with respect to the first normal.
申请公布号 EP1462760(A1) 申请公布日期 2004.09.29
申请号 EP20040004880 申请日期 2004.03.02
申请人 KLINGELNBERG GMBH 发明人 MIES, GEORG
分类号 G01B21/00;G01B5/004;G01B11/00;(IPC1-7):G01B7/008;G01B21/04;G01B5/008 主分类号 G01B21/00
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