发明名称 |
Test methods, systems, and probes for high-frequency wireless-communications devices |
摘要 |
A test probe for a high-frequency device having an electronic circuit with two or more contact regions. The test probe comprises two or more signal probe tips. Each signal probe tip has a contact surface area for contacting one of the contact regions of the device. A ground probe has a ground contact surface with a surface area substantially greater than the contact surface area of the one signal probe tip for contacting another one of the contact regions of the electronic circuit. The ground probe is positioned between at least two of the signal probes.
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申请公布号 |
US6798223(B2) |
申请公布日期 |
2004.09.28 |
申请号 |
US20000725646 |
申请日期 |
2000.11.29 |
申请人 |
HEI, INC. |
发明人 |
HUANG GUANGHUA;WAMBEKE GREGORY |
分类号 |
G01R1/073;G01R1/067;G01R31/00;G01R31/28;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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