发明名称 ELECTRIC CONDUCTOR INSPECTING DEVICE AND ELECTRIC CONDUCTOR INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an electric conductor inspecting apparatus for precisely inspecting the state of an inspection target without any contact when the inspection target is a conductor. SOLUTION: Two sensor plates 570, 580 are arranged nearly in parallel near a conductor 520 to be inspected, where an inspection signal is fed from a power-feeding section. The shape of a conductive tab opposite to the sensor plate 570 is inspected according to a measurement level from the sensor plate 570. Simultaneously, a detection signal from the sensor plates 570, 580 is subtracted by a subtractor 550. A detection value from one sensor plate is subtracted by a subtraction result using a divider 560 for normalizing a detection value from one sensor plate. The relative detection signal value ratio from both the sensor plates is detected for obtaining a detection result corresponding to the distance between the sensor plate and the conductor 520 as X. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004264272(A) 申请公布日期 2004.09.24
申请号 JP20030102227 申请日期 2003.02.28
申请人 OHT INC 发明人 YAMAOKA HIDEJI;NURIOKA AKIRA;HAYASHI YOSHIO;ISHIOKA SEIGO
分类号 G01R31/02;G01B7/28;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
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