发明名称 PHOTORESIST COATING APPARATUS TO REMOVE RESIDUAL PHOTORESIST FROM FLAT ZONE
摘要 PURPOSE: A photoresist coating apparatus is provided to remove a residual photoresist from a flat zone by wrapping a wafer and injecting a cleaning solution to the wafer. CONSTITUTION: A wafer is loaded on a spin chuck(100). The spin chuck is moved vertically to a top part or a bottom part. An injection nozzle is used for injecting a photoresist on a surface of the wafer. A cleaning unit removes the residual photoresist from an edge of the wafer. The cleaning unit includes a storage member for wrapping the wafer, an injection part(220) installed within the storage member to inject the cleaning solution to the edge of the wafer, and a draining part(230) for draining the cleaning solution.
申请公布号 KR20040082185(A) 申请公布日期 2004.09.24
申请号 KR20030016863 申请日期 2003.03.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, MYEONG GYU
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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