发明名称 SILICON CARBIDE SEMICONDUCTOR DEVICE AND FABRICATING METHOD THEREOF TO IMPROVE RELIABILITY
摘要 PURPOSE: A silicon carbide semiconductor device is provided to improve reliability by maintaining low contact resistance between a silicon carbide layer and an electrode while improving adhesion between the electrode and an interlayer dielectric. CONSTITUTION: A semiconductor layer is made of silicon carbide. An electrode is formed on the semiconductor layer. An interlayer dielectric(11) is formed on the electrode. An interconnection passes through the interlayer dielectric to reach the electrode. The electrode includes the first electrode part in contact with the semiconductor layer and the second electrode part between the first electrode part and the interlayer dielectric.
申请公布号 KR20040082337(A) 申请公布日期 2004.09.24
申请号 KR20040018241 申请日期 2004.03.18
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 KUSUMOTO OSAMU;KITABATAKE MAKOTO;TAKAHASHI KUNIMASA;YAMASHITA KENYA;MIYANAGA RYOKO;UCHIDA MASAO
分类号 H01L21/335;H01L21/04;H01L23/485;H01L29/24;H01L29/45;H01L29/78;H01L29/808;H01L29/812;(IPC1-7):H01L21/335 主分类号 H01L21/335
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