发明名称 CLEANING METHOD OF SYNTHETIC RESIN-MADE CONTAINER
摘要 PROBLEM TO BE SOLVED: To prevent a compound semiconductor wafer from being contaminated by outgassing from a container when the wafer is accommodated in a synthetic resin-made container and stored or delivered, and to prevent generation of faults in quality when epitaxial growth is performed to the wafer. SOLUTION: In the cleaning method of a synthetic resin-made container which is used for storing or delivering a compound semiconductor wafer subjected to mirror polishing, the container is heated for a constant period of time at a prescribed temperature (desirably at least 80°C) in a vacuum atmosphere before the wafer is accommodated. By flashing and eliminating volatile component, cleaning is performed. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004265965(A) 申请公布日期 2004.09.24
申请号 JP20030052434 申请日期 2003.02.28
申请人 NIKKO MATERIALS CO LTD 发明人 KURITA HIDEKI;SATO TSUTOMU;IZUMI SEIICHI
分类号 H01L21/673;H01L21/304;H01L21/68;(IPC1-7):H01L21/304 主分类号 H01L21/673
代理机构 代理人
主权项
地址