发明名称 TEST SOCKET FOR LEADLESS CHIP CARRIER
摘要 PROBLEM TO BE SOLVED: To solve the problem that, since the distal end of a contact pin part performs a circular-arc operation and the contact pin itself has a resilience, a conventional contact pin formed at its distal end of a curved surface slips on the surface of an electrode so that the distal end is brought into contact with a semiconductor element on a C/C. SOLUTION: A cutout contact pin 7 draws a circular-arc shape orbit and is brought into contact with the electrode on the C/C 1. A cutout part 7d becoming (C/C end-distance between the semiconductor elements)>"C/C end-distance between distal ends of the contact pins, is formed at the distal end part of the cutout contact pin 7. Thus, the contact position from the C/C end can be restricted/decided at the stage of designing, and it can prevent the distal end of the contact pin 7 from being brought into contact with the semiconductor element 4. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004264140(A) 申请公布日期 2004.09.24
申请号 JP20030054445 申请日期 2003.02.28
申请人 NEC ENGINEERING LTD 发明人 SUZUKI HIROTOSHI
分类号 G01R31/26;G01R1/073;H01L23/32;H01R33/76;H01R33/97;(IPC1-7):G01R31/26 主分类号 G01R31/26
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