| 摘要 |
A semiconductor integrated circuit device includes a plurality of internal circuits, internal potential generating circuits for converting a level of an external power supply potential to supply an internal potential at a level corresponding to a level set signal, a control portion for successively applying the plurality of level set signals to each of the internal potential generating circuits, and a measuring circuit for comparing each internal potential with a reference potential, and holding information representing results of the comparison. During a test period, a comparing circuit in the internal potential generating circuit compares a level corresponding to the level set signal with a comparison reference potential.
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