发明名称 Mass analyzer having improved mass filter and ion detection arrangement
摘要 An improved mass analyzer is set forth. In accordance with one embodiment, the mass analyzer employs a unique mass filter design that comprises an ion selection chamber in which ions are selected for detection based on their mass-to-charge ratio (m/Q) by subjecting them to a non-rotating, oscillating electric field that, ignoring any fringing effects, oscillates principally in a single coordinate plane (i.e., the y-z plane). The ions may be injected into the ion selection chamber at a significant angle with respect to the inlet of the chamber and in the single coordinate plane to raise the m/Q resolution to the desired level. In accordance with a further embodiment of the mass analyzer, an ion detection surface is arranged at the outlet of the ion selection chamber so that ions falling within a predetermined exit angle range are detected to the general exclusion of ions having other exit angles.
申请公布号 US6794647(B2) 申请公布日期 2004.09.21
申请号 US20030374771 申请日期 2003.02.25
申请人 BECKMAN COULTER, INC. 发明人 FARNSWORTH VINCENT R.;FASSETT JOHN R.
分类号 H01J49/42;(IPC1-7):B01D59/44 主分类号 H01J49/42
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