发明名称 Method of objectively evaluating a surface mark
摘要 A method of objectively evaluating a surface mark provides an objective test methodology for the optical quantification of surface marks. The method may include the steps of reproducibly producing a surface mark on an object and optically evaluating the surface mark. The surface mark may be reproducibly produced by loading a stylus, contacting a surface on the object with the loaded stylus and moving the object and the surface thereon relative to the loaded stylus so as to thereby produce a mark on the surface. Any surface mark is optically evaluated by optically producing images of the surface mark, electronically capturing the optically produced images and measuring selected parameters of the captured optically produced images.
申请公布号 US6795201(B2) 申请公布日期 2004.09.21
申请号 US20030394673 申请日期 2003.03.21
申请人 GENERAL ELECTRIC COMPANY 发明人 RANGARAJAN PRATIMA;WATKINS VICKI HERZL;HARDING KEVIN GEORGE;DEVITT JOHN WILLIAM
分类号 G01N21/94;(IPC1-7):G01B11/22 主分类号 G01N21/94
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