发明名称 GATE DRIVING CIRCUIT FOR THIN FILM TRANSISTOR LIQUID CRYSTAL DISPLAY AND DRIVING INTEGRATED CIRCUIT PROVIDED WITH THE SAME, ESPECIALLY REDUCING TEST TIME FOR TESTING CURRENT DRIVING CAPABILITY
摘要 PURPOSE: A gate driving circuit for a thin film transistor(TFT) liquid crystal display and a driving integrated circuit(IC) provided with the same are provided to reduce the test time required for testing the current driving capability. CONSTITUTION: A circuit(100) for driving a thin film transistor(TFT) liquid crystal display gate includes a level shift stage(50), a test control circuit stage(70) and a buffer stage(80). The level shift stage outputs the level of the converted input signal. The test control circuit stage is provided with an input terminal for a test signal and an input terminal for a test control signal. The test control circuit stage is controlled by the test control signal, outputs the output signal of the level shift terminal during the normal operation and outputs the test signal inputted from the test signal input terminal together with blocking the output signal of the level shift stage during the test operation. And, the buffer stage outputs the signal driving the TFT gate line consisting the TFT LCD panel by inputting the signal outputted from the test control circuit stage.
申请公布号 KR100450659(B1) 申请公布日期 2004.09.20
申请号 KR19970041964 申请日期 1997.08.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HUI CHEOL
分类号 G09F11/00;(IPC1-7):G09F11/00 主分类号 G09F11/00
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