INTEGRATED CIRCUIT TO REDUCE NUMBER OF PINS FORMED OUTSIDE INTEGRATED CIRCUIT AND IMPROVE TEST ABILITY IN PERIPHERAL BLOCKS

摘要

PURPOSE: An integrated circuit is provided to reduce the number of pins formed outside an integrated circuit and improve a test ability in peripheral blocks by using minimum number pins. CONSTITUTION: An integrated circuit(34) includes input pins, output pins and the first to third blocks(31,32,33) serially connected between the input pins and the output pins. The first test pins are prepared. A multiplexer selects one of the signals outputted from the first block and the signals inputted from the outside of the integrated circuit through the first test pins and outputs the selected signal to the third block. A control signal for controlling the multiplexer is inputted to a select pin.