发明名称 METHOD FOR FORMING STORAGE NODE OF SEMICONDUCTOR CAPACITOR TO PREVENT BOWING AND BRIDGE BETWEEN ADJACENT STORAGE NODES
摘要 PURPOSE: A method for forming a storage node of a semiconductor capacitor is provided to prevent bowing and bridge between adjacent storage nodes by forming a nitride layer for a spacer before depositing a polysilicon layer for the storage node. CONSTITUTION: An interlayer dielectric(21) is formed on a substrate(20). A poly plug(22) is formed in the interlayer dielectric. A sacrificial oxide layer(24) is formed on the resultant structure to expose the poly plug. A nitride layer as a spacer is formed at both sidewalls of the sacrificial oxide layer. The exposed poly plug is partially removed. Then, a polysilicon layer is formed on the recessed poly plug(22). By using a deep-out mask, the nitride layer and the sacrificial oxide layer are removed.
申请公布号 KR20040080597(A) 申请公布日期 2004.09.20
申请号 KR20030015455 申请日期 2003.03.12
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, GEUN MIN;KIM, GYU HYEON;YOON, HYO GEUN
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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