发明名称 WIRE BONDING METHOD TO FORM NANO-SCALE BONDING BY USING SCANNING PROBE MICROSCOPE
摘要 PURPOSE: A wire bonding method is provided to overcome the limit of image resolution and to form nano-scale bonding by using SMP(Scanning Probe Microscope). CONSTITUTION: A position for wire bonding is selected by using an optical microscope(S301). Surface roughness information of the selected position is determined by using an SMP(Scanning Probe Microscope)(S302). A wire bonding point is selected according to the surface roughness information(S303). Then, wire bonding is performed at the selected point(S304).
申请公布号 KR20040080215(A) 申请公布日期 2004.09.18
申请号 KR20030015110 申请日期 2003.03.11
申请人 LG ELECTRONICS INC. 发明人 KIM, HYEON HA;KIM, JEONG HO;LEE, JEONG SU;MUN, SANG JIN
分类号 H01L21/60 主分类号 H01L21/60
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