发明名称 |
WIRE BONDING METHOD TO FORM NANO-SCALE BONDING BY USING SCANNING PROBE MICROSCOPE |
摘要 |
PURPOSE: A wire bonding method is provided to overcome the limit of image resolution and to form nano-scale bonding by using SMP(Scanning Probe Microscope). CONSTITUTION: A position for wire bonding is selected by using an optical microscope(S301). Surface roughness information of the selected position is determined by using an SMP(Scanning Probe Microscope)(S302). A wire bonding point is selected according to the surface roughness information(S303). Then, wire bonding is performed at the selected point(S304).
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申请公布号 |
KR20040080215(A) |
申请公布日期 |
2004.09.18 |
申请号 |
KR20030015110 |
申请日期 |
2003.03.11 |
申请人 |
LG ELECTRONICS INC. |
发明人 |
KIM, HYEON HA;KIM, JEONG HO;LEE, JEONG SU;MUN, SANG JIN |
分类号 |
H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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