| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device which can carry out a self-test of an operation margin effectively at a low cost. SOLUTION: The semiconductor integrated circuit device has a functional block with a semiconductor circuit including a central processing unit, a memory storing a self-test program for carrying a self-test of a semiconductor circuit inside the functional block, a first transformation circuit which converts a power supply voltage input from an outside to a prescribed voltage and outputs it, and a second transformation circuit which converts output from the first transformation circuit at a prescribed ratio and outputs it as an operation voltage for a self-test to the functional block. The central processing unit is constituted to control a voltage output from the first transformation circuit and the second transformation circuit according to a self-test program, and to carry out a self-test of a semiconductor circuit autonomously. COPYRIGHT: (C)2004,JPO&NCIPI
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