发明名称 DEFECT MARK MARKING METHOD, AND METAL STRIP WITH DEFECT MARK MARKED THEREON
摘要 PROBLEM TO BE SOLVED: To provide a defect marking method by which a metal strip is carried, defects are detected while measuring the length of the metal strip in the longitudinal direction, defect marks are marked at positions of the defects, the longitudinal positions are recorded in a recording means, and the corresponding marks are checked based on the information on the longitudinal positions of the defect marks recorded in the recording means in a subsequent step, and to provide the metal strip on which the defect marks are marked. SOLUTION: In the defect mark marking method, at least one reference mark at the known longitudinal position is marked on a metal strip together with the marking of the defect mark. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004255412(A) 申请公布日期 2004.09.16
申请号 JP20030048748 申请日期 2003.02.26
申请人 JFE STEEL KK 发明人 TOMURA YASUO
分类号 B21C51/00;(IPC1-7):B21C51/00 主分类号 B21C51/00
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