发明名称 SYSTEM AND METHOD FOR ACCUMULATING A PLURALITY OF METAL GATES APPLIED TO CMOS
摘要 PROBLEM TO BE SOLVED: To provide a dual gate MOSFET having a metal gate stack, and further a method for setting a threshold voltage in such a MOSFET. SOLUTION: A method includes a process of forming a gate oxide layer overlapped on the first and second channel regions; a process of forming a first metal layer, having a first thickness overlapped on the gate oxide layer; a process of forming a second metal layer, having a second thickness overlapped on the first metal layer having the first thickness; a process of selectively removing the second metal layer overlapped on the first channel region; a process of forming a third metal layer; a process for providing a first MOSFET, having a gate work function, according to the thickness of the first and third metal layers overlapped on the first-channel region; and a process of providing a second MOSFET complementary to the first MOSFET, having a gate work function according to the total of the thickness of the first, second, and third metal layers which overlap the second channel region. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004260165(A) 申请公布日期 2004.09.16
申请号 JP20040039093 申请日期 2004.02.16
申请人 SHARP CORP 发明人 GAO WEI;CONLEY JOHN F JR;YOSHI ONO
分类号 H01L21/28;H01L21/336;H01L21/8238;H01L27/092;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L21/823 主分类号 H01L21/28
代理机构 代理人
主权项
地址