发明名称 Automatic testing system
摘要 An automatic testing system. A sampling and converting device obtains a plurality of electronic parameters from a tested device and transforms them into a plurality of digital signals. A microprocessor receives the digital signals and performs various short-circuit tests, over-current tests and over-voltage tests in a specific sequence.
申请公布号 US2004181355(A1) 申请公布日期 2004.09.16
申请号 US20040753435 申请日期 2004.01.09
申请人 LIU KEN-HO;WANG LI-PING;MAO CHANG-GEN;ZHANG HUA-LIANG 发明人 LIU KEN-HO;WANG LI-PING;MAO CHANG-GEN;ZHANG HUA-LIANG
分类号 G01R31/02;G06F19/00;(IPC1-7):G06F19/00 主分类号 G01R31/02
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