发明名称 |
Automatic testing system |
摘要 |
An automatic testing system. A sampling and converting device obtains a plurality of electronic parameters from a tested device and transforms them into a plurality of digital signals. A microprocessor receives the digital signals and performs various short-circuit tests, over-current tests and over-voltage tests in a specific sequence.
|
申请公布号 |
US2004181355(A1) |
申请公布日期 |
2004.09.16 |
申请号 |
US20040753435 |
申请日期 |
2004.01.09 |
申请人 |
LIU KEN-HO;WANG LI-PING;MAO CHANG-GEN;ZHANG HUA-LIANG |
发明人 |
LIU KEN-HO;WANG LI-PING;MAO CHANG-GEN;ZHANG HUA-LIANG |
分类号 |
G01R31/02;G06F19/00;(IPC1-7):G06F19/00 |
主分类号 |
G01R31/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|