发明名称 |
Mold die and method for manufacturing semiconductor device using the same |
摘要 |
An object of the present invention is to provide a technology that can seal the opening of the interposer by transfer mold with the leak of the insulating resin from the above-described opening prevented. A mold die comprising a first die having a recess in a predetermined form and a second flat die, the above-described mold die being for disposing the above-described first die on a surface of a wiring board which has a plurality of openings and bears a semiconductor chip via an elastic material, which surface bears the above-described semiconductor chip, and for disposing the above-described second die on a back of the above-described surface of the above-described wiring board which bears the above-described semiconductor chip, and for sealing with an insulating resin a periphery of the above-described semiconductor chip and at least one of the above-described openings of the above-described wiring board, wherein the above-described second die comprises a protrusion around an area overlapping the above-described opening sealed with the above-described insulating resin.
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申请公布号 |
US2004180475(A1) |
申请公布日期 |
2004.09.16 |
申请号 |
US20040797003 |
申请日期 |
2004.03.11 |
申请人 |
SHIBATA AKIJI;OKAMOTO AKIHIRO;SHIMAZAKI YOSUKE;KOMIYA KAZUMOTO |
发明人 |
SHIBATA AKIJI;OKAMOTO AKIHIRO;SHIMAZAKI YOSUKE;KOMIYA KAZUMOTO |
分类号 |
H01L23/12;H01L21/56;H01L23/31;(IPC1-7):H01L21/48 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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