发明名称 |
Structures for testing circuits and methods for fabricating the structures |
摘要 |
One embodiment of the present invention is a method for fabricating a structure useful for testing circuits that includes steps of: (a) aligning a first side of a connector-holder comprised of electrical connectors having retractable ends that are extendable out of the first side of the connector-holder and having retractable ends that are extendable out of a second side of the connector-holder with a substrate; and (b) connecting ends extendable out of the first side to pads on the substrate to form the structure.
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申请公布号 |
US2004178812(A1) |
申请公布日期 |
2004.09.16 |
申请号 |
US20030386875 |
申请日期 |
2003.03.12 |
申请人 |
NEXCLEON, INC. |
发明人 |
KARAVAKIS KONSTANTINE N.;NGUYEN TOM T. |
分类号 |
G01R1/04;G01R31/28;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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