发明名称 Eddy current probe and associated inspection method
摘要 An eddy current probe and associated method of inspecting a structure are provided that are capable of generating a two-dimensional image of the structure, generally in real time. The eddy current probe includes an eddy current probe array having a plurality of first and second coils that cross one another to define a plurality of sensing elements. The eddy current probe array may also include a plurality of magnetically permeable core elements located coincident with respective sensing elements and at least partially encircled by respective first and second coils. The eddy current probe may also include an alternating current source electrically connected to the first coils and sense electronics for sensing current induced in the second coils. In operation, the current sensed in the second coils represents at least one characteristic of the structure, such as the electrical conductivity of the structure.
申请公布号 US2004178790(A1) 申请公布日期 2004.09.16
申请号 US20030389420 申请日期 2003.03.14
申请人 GIFFORD CARL B.;UYEHARA CLYDE T. 发明人 GIFFORD CARL B.;UYEHARA CLYDE T.
分类号 G01N27/90;(IPC1-7):G01N27/82;G01R33/12 主分类号 G01N27/90
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