发明名称 Lithographic apparatus with debris suppression, and device manufacturing method
摘要 A lithographic projection apparatus is disclosed. The apparatus includes a radiation system that includes a radiation source and an illumination system that supplies a beam of radiation, and a support structure that supports a patterning structure. The patterning structure is configured to pattern the beam of radiation according to a desired pattern. The apparatus also includes a substrate support that supports a substrate, a projection system that projects the patterned beam onto a target portion of the substrate, an electrode, and a voltage source that applies an electric field between the radiation source and the electrode to generate a discharge between the radiation source and the electrode.
申请公布号 US2004179182(A1) 申请公布日期 2004.09.16
申请号 US20030743270 申请日期 2003.12.23
申请人 ASML NETHERLANDS B.V. 发明人 BAKKER LEVINUS PIETER
分类号 G21K5/00;G03F7/20;G21K5/02;H01L21/027;H05H1/24;(IPC1-7):G03B27/00;G03B27/72 主分类号 G21K5/00
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