发明名称 Lithographic apparatus comprising a temperature conditioned load lock
摘要 <p>Load lock for a lithographic apparatus arranged to transfer an object, like a substrate (W), into and from the lithographic apparatus. The load lock outer wall (38'; 40) defining at least part of a load lock volume accommodating a support unit (33; 141) for supporting the object (W) when in said load lock. The load lock also has a temperature conditioned structure to control the temperature of the object to a desired temperature at least before the object is transferred from the load lock towards the lithographic projection apparatus. &lt;IMAGE&gt;</p>
申请公布号 EP1457830(A2) 申请公布日期 2004.09.15
申请号 EP20040075729 申请日期 2004.03.05
申请人 ASML NETHERLANDS B.V. 发明人 KLOMP, ALBERT J. H.;HOOGKAMP, JAN F.;VISSER, RAIMOND;VUGTS, JOSEPHUS C. J. A.;VULLINGS, HENRICUS J. L. M.;KUIPERS, LEO W. M.;FRANSSEN, JOHANNES H. G.
分类号 G03F7/20;(IPC1-7):G03F7/20 主分类号 G03F7/20
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