发明名称 |
Lithographic apparatus comprising a temperature conditioned load lock |
摘要 |
<p>Load lock for a lithographic apparatus arranged to transfer an object, like a substrate (W), into and from the lithographic apparatus. The load lock outer wall (38'; 40) defining at least part of a load lock volume accommodating a support unit (33; 141) for supporting the object (W) when in said load lock. The load lock also has a temperature conditioned structure to control the temperature of the object to a desired temperature at least before the object is transferred from the load lock towards the lithographic projection apparatus. <IMAGE></p> |
申请公布号 |
EP1457830(A2) |
申请公布日期 |
2004.09.15 |
申请号 |
EP20040075729 |
申请日期 |
2004.03.05 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
KLOMP, ALBERT J. H.;HOOGKAMP, JAN F.;VISSER, RAIMOND;VUGTS, JOSEPHUS C. J. A.;VULLINGS, HENRICUS J. L. M.;KUIPERS, LEO W. M.;FRANSSEN, JOHANNES H. G. |
分类号 |
G03F7/20;(IPC1-7):G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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