Assembly comprising a sensor for determining at least one of tilt and height of a substrate, a method therefor and a lithographic projection apparatus

摘要

The invention relates an assembly comprising a sensor for determining at least one of tilt and height of a surface of a substrate (W; 11) in a lithographic projection apparatus (1). The substrate (W; 11) being moveable along at least one path substantially parallel to the surface of the substrate with respect to the sensor. The lithographic projection apparatus having an exposure scanning direction (y), the assembly being arranged to continuously move the substrate relative to said sensor along said at least one path and to provide measurement data about said at least one of tilt and height along said at least one path. The assembly comprising a memory (10) for storing said measurement data for use during a later exposure of said substrate by said lithographic projection apparatus. Said at least one path of the substrate being at least partly at an angle to the exposure scanning direction.