| 摘要 |
<p>The method of the invention determines and/or monitors a physical or chemical process parameter of a liquid or solid medium. The invention provides measurements which represent a physical or chemical parameter, are taken. A measurement approximately constant over a predetermined time interval is used for recognizing a malfunction of a measuring device, especially for recognizing accretions on the sensor side thereof or cumulatively, a measurement approximately constant over a predetermined time interval is used for recognizing a malfunction of the electronics of the measuring device. Also alternatively or cumulatively, a measurement approximately constant over a predetermined time interval is used for recognizing a process-side change and/or a malfunction caused by the process.</p> |
