Method for forming a storage cell capacitor compatible with high dielectric constant materials

摘要

The invention is a storage cell capacitor having a storage node electrode comprising a barrier layer interposed between a conductive plug and an oxidation resistant layer. A thick insulative layer protects the sidewall of the barrier layer during the deposition and anneal of a dielectric layer having a high dielectric constantThe method comprises forming the conductive plug in a thick layer of insulative material such as oxide or oxide/nitride. The conductive plug is recessed from a planarized top surface of the thick insulative layer. The barrier layer is formed in the recess and the top surface of the barrier layer is recessed below the top surface of the oxide or oxide/nitride layer. The process continued with a formation of an oxidation resistant conductive layer and the deposition of a further oxide layer to fill remaining portions of the recess. The oxidation resistant conductive layer is planarized to expose the oxide or oxide/nitride layer and the oxide layers are then etched to expose the top surface and vertical portions of the oxidation resistant conductive layer.Next a dielectric layer having a high dielectric constant is formed to overlie the storage node electrode and a cell plate electrode is fabricated to overlie the dielectric layer.