发明名称 Apparatus and method for testing socket
摘要 An apparatus and a method for testing a socket are disclosed. The resistance values of the contactor pins of the socket can be precisely measured, and the measurement is made automatic so as to decrease the expense and manpower. The method includes the following steps. That is, a calibration PCB is formed into a closed circuit, and all the resistance values forming a closed circuit loop for respective channels are extracted and stored (first step). A socket-installed PCB is formed into a closed circuit, and all resistance values forming a closed circuit loop for respective channels are extracted and stored (second step). Differences between the resistance values of the respective channels of the calibration PCB and the resistance values of the respective channels of the socket-installed PCB are calculated (third step). The differences thus calculated are displayed to a screen for the respective channels (fourth step).
申请公布号 US6792376(B2) 申请公布日期 2004.09.14
申请号 US20030353217 申请日期 2003.01.27
申请人 SEMIBANK CO., LTD 发明人 LEE ILL YOUNG;BYON DONG MYUN;KANG TAE WON;KIM SEI WOONG
分类号 G01R1/073;G01R31/02;G01R31/28;G01R35/00;H01R33/76;(IPC1-7):G01R31/00 主分类号 G01R1/073
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