发明名称 APPARATUS AND METHOD FOR GENERATING HIGH ORDER HARMONIC X-RAY AND PINHOLE DIFFRACTION INTERFEROMETER USING HIGH ORDER HARMONIC X-RAY
摘要 PURPOSE: An apparatus and a method for generating high order harmonic X-ray, and a pinhole diffraction interferometer using the high order harmonic X-ray are provided to increase industrial utility by simplifying the structure of an interferometer using a micro thin film. CONSTITUTION: A laser beam focusing strength controller(11) controls dimension of energy and beam of a femtosecond laser generated in a high-power femtosecond laser generator(10). A target(20) is filled with argon gas which focuses the femtosecond laser beam to generate high order harmonic X-ray. A gas pressure controller(21) controls the argon gas. The high order harmonic X-ray beam generates single-order harmonic wave under the control of the laser beam focusing strength controller and the gas pressure controller.
申请公布号 KR20040079191(A) 申请公布日期 2004.09.14
申请号 KR20030014134 申请日期 2003.03.06
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 LEE, DONG GEUN;NAM, CHANG HUI
分类号 G01B9/02;G01N23/20;G21K1/06;G21K5/02;H01S4/00;H05G1/00;H05G2/00;(IPC1-7):H05G1/00 主分类号 G01B9/02
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