发明名称 |
APPARATUS AND METHOD FOR GENERATING HIGH ORDER HARMONIC X-RAY AND PINHOLE DIFFRACTION INTERFEROMETER USING HIGH ORDER HARMONIC X-RAY |
摘要 |
PURPOSE: An apparatus and a method for generating high order harmonic X-ray, and a pinhole diffraction interferometer using the high order harmonic X-ray are provided to increase industrial utility by simplifying the structure of an interferometer using a micro thin film. CONSTITUTION: A laser beam focusing strength controller(11) controls dimension of energy and beam of a femtosecond laser generated in a high-power femtosecond laser generator(10). A target(20) is filled with argon gas which focuses the femtosecond laser beam to generate high order harmonic X-ray. A gas pressure controller(21) controls the argon gas. The high order harmonic X-ray beam generates single-order harmonic wave under the control of the laser beam focusing strength controller and the gas pressure controller.
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申请公布号 |
KR20040079191(A) |
申请公布日期 |
2004.09.14 |
申请号 |
KR20030014134 |
申请日期 |
2003.03.06 |
申请人 |
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
LEE, DONG GEUN;NAM, CHANG HUI |
分类号 |
G01B9/02;G01N23/20;G21K1/06;G21K5/02;H01S4/00;H05G1/00;H05G2/00;(IPC1-7):H05G1/00 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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