发明名称 |
Methods and apparatus for characterizing board test coverage |
摘要 |
Disclosed are methods and apparatus for characterizing board test coverage. In one method, potentially defective properties are enumerated for a board, without regard for how the potentially defective properties might be tested. For each potentially defective property enumerated, a property score is generated. Each property score is indicative of whether a test suite tests for a potentially defective property. Property scores are then combined in accordance with a weighting structure to characterize board test coverage for the test suite.
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申请公布号 |
US6792385(B2) |
申请公布日期 |
2004.09.14 |
申请号 |
US20020233768 |
申请日期 |
2002.09.01 |
申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
PARKER KENNETH P.;HIRD KATHLEEN J.;RAMOS ERIK A. |
分类号 |
G01R31/28;(IPC1-7):G06F9/02 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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