发明名称 Memory device capable of calibration and calibration methods therefor
摘要 A memory device having a cross point array of memory cells includes a temperature sensor and a reference memory cell. The temperature sensor senses the temperature of the memory device and data from the temperature sensor and the reference memory cell are used to update write currents used to program the array of memory cells. A method of calibrating the memory device involves detecting a temperature of the memory device, determining whether the temperature of the memory device has changed by a threshold value, and updating write current values if the temperature of the memory device changes by the threshold value. The write current values can be updated by data from the reference memory cell, or from write current values stored in a lookup table.
申请公布号 US6791874(B2) 申请公布日期 2004.09.14
申请号 US20040753298 申请日期 2004.01.08
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 TRAN LUNG T.;BHATTACHARYYA MANOJ K.
分类号 G11C11/15;G11C11/16;G11C29/50;H01L21/8246;H01L27/105;H01L43/08;(IPC1-7):G11C11/00 主分类号 G11C11/15
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