发明名称 Semiconductor device
摘要 A semiconductor integrated circuit includes non-volatile memory elements (PM1, PM2), each of which has a first source electrode, a first drain electrode, a floating gate electrode and a control gate electrode and is capable of having different threshold voltages, and read transistor elements (DM1, DM2), each of which has a second source electrode and a second drain electrode and is capable of having different mutual conductances according to the threshold voltage of the non-volatile memory element. The read transistor element has a switching state according to the electron injection state or the electron emission state, in other words, the writing state or the erasing state of the floating gate electrode. In a read operation, it is not necessary to cause a channel current to flow according to the threshold voltage of the non-volatile memory element.
申请公布号 US6791881(B2) 申请公布日期 2004.09.14
申请号 US20030627821 申请日期 2003.07.28
申请人 发明人
分类号 H01L21/8247;G11C16/04;H01L21/82;H01L27/10;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/10 主分类号 H01L21/8247
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