发明名称 |
METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE TO FORM A SMOOTH STORAGE NODE |
摘要 |
PURPOSE: A method for forming a capacitor of a semiconductor device is provided to form a smooth storage node by using a hard mask of amorphous silicon. CONSTITUTION: An interlayer dielectric(2) is formed on a semiconductor substrate(1). A plurality of plugs(4) are formed by patterning the interlayer dielectric. A barrier layer(6) is formed thereon. A capacitor oxide layer(8) is formed on the barrier layer. A hard mask layer is formed on the capacitor oxide layer and an annealing process is performed thereon. A photoresist is coated on the hard mask. A storage node pattern is formed by performing an exposure process. The exposed hard mask is etched by the exposure process. The exposed capacitor oxide layer is etched thereby. A storage node(14) is formed on the entire surface of the etched capacitor oxide layer.
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申请公布号 |
KR20040079174(A) |
申请公布日期 |
2004.09.14 |
申请号 |
KR20030014116 |
申请日期 |
2003.03.06 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHAE, SU JIN;KIM, HAE WON |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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主权项 |
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地址 |
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