APPARATUS FOR INSPECTING OPTICAL ELEMENTS IN WHICH LIGHT RADIATED FROM AN OPTICAL MODULE IS TRANSFERRED TO A BEAM SPLITTER THROUGH A FIRST OPTICAL PATH CONVERTER

摘要

PURPOSE: An optical element inspection apparatus is provided to precisely inspect optical characteristics of optical elements by using an interferometer employing various wavelengths. CONSTITUTION: An optical element inspection apparatus includes a plurality of light sources, a beam splitter(15) for splitting light radiated from the light sources, and first and second reflection mirrors(25,30). The light sources include first light source(3) for radiating a first color light having a first wavelength, a second light source(5) for radiating a second color light having a second wavelength, and a third light source(10) for radiating a third color light having a third wavelength. The first and second light sources(3,5) are provided as an optical module(8). The light radiated from the optical module(8) is transferred to the beam splitter(15) through a first optical path converter(12).