发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE TO SOLVE STEP DIFFERENCE BETWEEN CELL AND PERIPHERAL REGIONS |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to improve uniformity between cell regions and peripheral regions by simultaneously forming a storage node on the cell region and a metal pattern on the peripheral region. CONSTITUTION: A wafer(201) having a transistor is prepared. A bit line contact region and a storage node contact region are simultaneously opened. A bit line contact plug(203a) and a storage node contact plug(203b) are formed by filling a polysilicon layer in the opening. A first insulating layer(204) is formed to expose the bit line contact plug. A bit line(205) is formed to connect the bit line contact plug. A second insulating layer(206) is formed to expose the storage node contact plug and a metal contact of a peripheral region. A storage node pattern(210a) and a metal pattern(210b) of the peripheral region are simultaneously formed.
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申请公布号 |
KR100450036(B1) |
申请公布日期 |
2004.09.14 |
申请号 |
KR19970029028 |
申请日期 |
1997.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, HYEONG SEOK |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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