发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE TO SOLVE STEP DIFFERENCE BETWEEN CELL AND PERIPHERAL REGIONS
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to improve uniformity between cell regions and peripheral regions by simultaneously forming a storage node on the cell region and a metal pattern on the peripheral region. CONSTITUTION: A wafer(201) having a transistor is prepared. A bit line contact region and a storage node contact region are simultaneously opened. A bit line contact plug(203a) and a storage node contact plug(203b) are formed by filling a polysilicon layer in the opening. A first insulating layer(204) is formed to expose the bit line contact plug. A bit line(205) is formed to connect the bit line contact plug. A second insulating layer(206) is formed to expose the storage node contact plug and a metal contact of a peripheral region. A storage node pattern(210a) and a metal pattern(210b) of the peripheral region are simultaneously formed.
申请公布号 KR100450036(B1) 申请公布日期 2004.09.14
申请号 KR19970029028 申请日期 1997.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, HYEONG SEOK
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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